Dynamic behavior of nanometer-scale amorphous intergranular film in silicon nitride by in situ high-resolution transmission electron microscopy

We report about the dynamic behavior of a nanometer-scale amorphous intergranular film (IGF) in a Si₃N₄ ceramic by an in situ heating experiment in a high-resolution transmission electron microscopy (HRTEM). During the experiment the IGF gradually vanishes at 820 °C accompanied by the formation of crystal planes within the IGF. The IGF reappears after cooling back to room temperature. The results cannot be explained within the framework of a force balance model. We argue that the dynamic behavior of the IGF in our experiment originates from the open system observed.     

Slip behaviour at cyclic pullout tests under transverse tension

In case of a reinforced concrete structure being exposed to bond stresses that transfer great forces, a relative displacement between reinforcing bar and concrete occurs. The slip is an important parameter in order to evaluate the quality of the bond concerning repeated pullout loads. A rapid slip increase is caused by bond weakening due to longitudinal cracks resulting from transverse tension. Within the bond area the slip is not uniformly distributed along the reinforcing bar. It is still unexplained how far fatigue and transverse tension affect the distribution. This paper focuses on the development of the slip curve under repeated loading and transverse tension. Results from cyclic pullout tests were applied and particularly the slip difference between the loaded and unloaded end of the pullout bar was investigated. It could be observed that both an increase in load cycles and transverse tension did not cause an appreciable change in slip difference.